Stratus Vision GmbH

Booth number E1.1829

AOI Automatic Inspection Systems Equipment for Manufacturing Electronics.

About us

Stratus Vision GmbH designs and produces AOI (Automated Optical Inspection) systems and technology since 2003, with offices and Agents in Hong Kong, Taiwan, Korea, Germany and USA. Our Core Technology is: Defect Inspection of Ceramic Multilayer Hybrids, LTCCs, HTCCs, interposers, sensors and other substrates. 2D and 3D metrology can be integrated with the 100% inspection. The STRATUS VISION AOI Systems will find typical defects (on wet or dry layers).

Stratus Vision GmbH
Benzstr. 28
82178 Puchheim

Phone: +49 89 413293201
Fax: +49 89 413293219

PASS Pacific Asian System Supply Ltd.
7/F, Unit B3, Yip Fung Industrial Bldg.
Hong Kong
Hong Kong

Phone: +852 2419 2012
Fax: +852 2439 0062
ASYS Group China (Shanghai) Co. Ltd.
5C, East Hope Placa, 1777 Century Avenue
200122 Pudong Shanghai
P.R. China

Products and services

AOI Automatic Inspection Systems Equipment for Manufacturing Electronics on ceramics and wafers. (e.g.application for LTCC/HTCC/SOFC/DBC/MLCC/SIC).
Stratus III AOI

The STRATUS III inspection solution for screen printed electronics has become the industry standard due to the flexibility, speed and easy of use for both setup and daily operation.

Offline Flex AOI

Fastest Speed with the Offline Flex AOI from Stratus. With this unique design the customers can also upgrade their solution later on to an automatic loaded machine with their own automation.
Also the offline flex machine offers highest measurement options with down to +/-1µm accuracies in all three axis.

Automatic AOI solutions

Loading and unloading systems can be integrated with the AOI solutions from Stratus, allowing a full control and monitoring of the substrate production from the screen printing until the packing.

News & Innovations

AOI STRATUS NANO inspection: X/Y resolutions 2um- 0.2um per pixel for sub micron defects on circuits
Substrates up to 12 inch (300mm)
Further reading
AOI STRATUS 3D inspection
STRATUS 3D inspection: (Z) Lateral resolutions from 0.5um
X/Y resolutions 20 um- 1um per pixel for micron size defects on circuits
Substrates up to 10 inch (250mm)
Further reading
AOI STRATUS MICRO inspection: X/Y resolutions 20um- 1um per pixel for micron size defects on circuits
Substrates up to 24 inch (600mm)
Further reading

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